Current fault detection for light emitters

ABSTRACT

A device includes a light emitter, a current sensing resistance, a current generator, and detection circuitry. The current generator is connected to the light emitter and to the current sensing resistance. During a normal operating mode of the device, the current generator regulates current flow through the light emitter. In a test mode, the current generator regulates current flow through the current sensing resistance. The detection circuitry, during the test mode, detects when current flow through the current sensing resistance is outside an expected range.

CROSS-REFERENCE TO RELATED APPLICATION

This is a Divisional of copending application Ser. No. 11/178,686, filedon Jul. 11, 2005, the entire disclosure of which is incorporated hereinby reference.

BACKGROUND

Products containing light emitting diodes (LEDs) or lasers that emitlight in the visible or infrared range are required to conform to eyesafety requirements in the International Electrotechnical Commission(IEC) standard 60825-1. If the optical flux that can impinge on a user'seye exceeds the standard set out in IEC 60825-1, the device must belabeled an eye safety hazard. This requirement applies not only duringnormal operation of the circuit, but also when predictable single faultsoccur in the circuit.

Fuses can be used in a safety circuit for lasers. When the bias currentto a laser light emitter exceeds the eye safety requirement, the fuseblows. Alternatively, a retriggerable transistor circuit can be usedthat shunts current away from a laser light emitter when the currentexceeds a design threshold.

Alternatively, a monitoring photodiode having an output indicative ofthe actual output of the laser can be used. For example, a comparatorcompares a reference signal indicative of a reference output level of alaser and a monitor photodiode signal. The comparator output signalreflects the change in the actual optical output level of the laser. Anabnormal current eliminator controls the comparator output so that thesignal has limited amplitude. Hence, the drive current to the laser isforcibly decreased to safe drive current levels. See U.S. Pat. No.4,884,280 issued to Kinoshita for “Semiconductor Laser Driving Devicefor Stabilizing the Optical Output Thereof”.

SUMMARY OF THE INVENTION

In accordance with an embodiment of the present invention, a deviceincludes a light emitter, a current sensing resistance, a currentgenerator, and detection circuitry. The current generator is connectedto the light emitter and to the current sensing resistance. During anormal operating mode of the device, the current generator regulatescurrent flow through the light emitter. In a test mode, the currentgenerator regulates current flow through the current sensing resistance.The detection circuitry, during the test mode, detects when current flowthrough the current sensing resistance is outside an expected range.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows an implementation of light emitter current fault detectionin accordance with an embodiment of the present invention.

FIG. 2 shows another implementation of light emitter current faultdetection in accordance with another embodiment of the presentinvention.

FIG. 3 shows another implementation of light emitter current faultdetection in accordance with another embodiment of the presentinvention.

DESCRIPTION OF THE EMBODIMENT

FIG. 1 is a simplified block diagram showing circuitry within anavigation sensor circuit 101 used to drive a light emitter 110. Forexample, navigation sensor circuit 101 is a navigation circuit such asthose found on an optical mouse or other optical devices used fordetection of motion. For example, navigation sensor circuit 101 isimplemented as an integrated circuit. For example, light emitter 110 isimplemented as a light emitting diode (LED), as a vertical-cavitysurface emitting laser (VCSEL) or some other device that emits light.

Within navigation sensor 101, a programmable current source 100regulates the current through light emitter 110 when a switch 112 is on.Current source 100 is connected, for example to a ground voltage 103internal to navigation sensor 101. For example, switch 112 isimplemented using a field effect transistor (FET).

A resistor 108 is a current sensing resistor used for detection offaults such as leakage resistance. A voltage value at a node 118 isdependent on a supply voltage (VCC) 109 and a forward voltage drop(V_110) across light emitter 110. The voltage drop across switch 112 isassumed to be negligible.

For example, a typical voltage value for supply voltage 109 is 2.8 volts(V). A typical voltage value at node 118 is 0.4 V. This means a typicalforward voltage drop (V_110) is equal to 2.4V. It is noted that incommon circuit design, current source 100 requires that voltage at node118 be above some minimum voltage for proper operation.

A control circuit 104 periodically performs fault detection. Forexample, fault detection is performed during each frame in whichnavigation sensor circuit 101 is used to capture an image illumined bylight emitter 110. In order to perform fault detection, control circuit104 turns off FET 112. Turning off FET 112 disconnects power supply 109from light emitter 110 causing the current through light emitter 110 tobecome substantially zero. Control circuit 104 turns on an FET 106 toconnect a reference voltage 107 to sense resistor 108. For example,reference voltage 107 can be VCC or be set at another regulated voltagevalue. Control circuit 104 turns on an FET 106 to connect a referencevoltage 107 to sense resistor 108. For example, reference voltage 107can be set at VCC or at another voltage value intermediate between VCCand the voltage at node 118. Control circuit 104 also sets currentsource 100 to a predetermined value. Substantially all the currentflowing through current source 100 flows through resistor 108, causing avoltage drop (V_108) across resistor 108. The voltage drop (V_108)across resistor 108 is equal to the current (I_108) flowing in resistor108 multiplied by the resistance value (R_108) of resistor 108 (i.e.,V_108=I_108 * R_108).

The voltage drop (V_108) across resistor 108 is converted to a digitalvalue by a differential amplifier 102 and an analog to digital converter(ADC) 116. A set of predetermined settings for current source 100 andexpected digital values from ADC 116 are stored in control circuit 104.If the digital values match the expected range, then control circuit 104resumes normal operation of navigation sensor 101 by turning off FET 106and turning on FET 112, and restoring current source 100 to theoperating current value. The configuration of differential amplifier 102is exemplary. For example, differential amplifier 102 can be implementedas a single-ended amplifier connected to node 118 with reference toground. Alternatively, differential amplifier 102 can be omitted and ADC116 be connected directly to node 118

Leakage can occur, for example when a spurious connection is madebetween node 118 and ground voltage 103 internal to navigation sensor101, or between node 118 and a ground voltage 105 external to navigationsensor 101. A spurious connection between node 118 and ground voltage103 is represented by a leakage resistance 115. A spurious connectionbetween node 118 and ground voltage 105 is represented by a leakageresistance 114.

If leakage resistance 114 and/or leakage resistance 115 is present, thecurrent flowing in leakage resistance 114 and/or leakage resistance 115adds to the total current in resistor 108. This increased currentincreases the voltage drop (V_108) across resistor 108.

The source of leakage resistance 114 could be, for example, a shortcircuit on the printed circuit board, for example due to a solder ballor cut off component lead not removed during assembly, or due to anothercause. Leakage resistance 114 could also be resistive, for example, dueto contamination, for example, from a spilled soft drink, or fromanother cause. The resistance can be very small or have a resistance ofhundreds or even thousands of ohms.

The source of leakage resistance 115 could be, for example, a circuitrydefect or other damage to the integrated circuitry of navigation sensor101.

During normal operation (e.g., a normal operating mode), current flowingthrough leakage resistance 114 and/or leakage resistance 115 (if eitherof these are present) adds to the total current flowing through lightemitter 110. This increases the optical power output of light emitter110, possibly exceeding the eye safety limit specified for the product.

Other types of fault that may be detected include the failure of FET 112to turn off, and a spurious connection between VCC 109 and a node 119.Neither of these faults will cause the light emitter power to increaseduring normal operation; however, these faults do represent a potentialsafety hazard due to the loss of light source control by FET 112 in theevent leakage resistance 114 or leakage resistance 115 is present.During the fault test cycle, these faults will decrease the currentthrough resistor 108 because some portion of the current flowing incurrent source 100 will flow through light emitter 110. The decreasedcurrent I_108 will cause lower than expected voltage V_108.

If, during a fault detection cycle (e.g., a test mode), the increasedvoltage across current sensing resistor 108 due to leakage resistance114 or leakage resistance 115, or the decreased voltage across currentsensing resistor 108 due to failure of FET 112 or spurious connection tonode 119, causes digital values from ADC 116 to exceed the expectedrange, a fault is detected. In this event control circuit 104 respondsto the fault detection. For example, upon detecting a fault, controlcircuit 104 holds FET 112 off and turns current source 100 off so thatlight emitter 110 remains off. Additionally, a user readable indicatorfault flag can be set.

While resistor 108 can be located internal to navigation sensor 101, itis currently advantageous, when navigation sensor is implemented as anintegrated circuit, to place resistor 108 external to the integratedcircuitry. When resistor 108 is located external to the integratedcircuitry, a low tolerance resistor, for example +/−1% of the nominalvalue, may be economically used. This compares to a typical tolerance of+/−20% for commonly available CMOS semiconductor processes. The lowtolerance of resistor 108 enables more precise measurement of leakageresistance 114 and leakage resistance 115, thereby allowing economicfault detection before the eye safety power is exceeded. The value ofresistor 108 is selected to achieve this goal.

Because sense resistor 108 is not in series with light emitter 110, noadditional voltage drop is introduced to node 118 during normaloperation.

Other types of faults will also be detected during the fault detectioncycle. For example, a fault in current source 100 that leads toincreased light emitter output power should be detected during the faultdetection cycle. During the fault increased current through currentsource 100 will result in higher digital values from ADC 116. When thedigital values from ADC 116 exceed the expected range, a fault isdetected.

Other errors resulting, for example, in reduction of voltage at node 118are also detectable. For example, when a reduction of voltage at node118 causes a reduction in current generated by current source 100 sothat the voltage values detected by ADC 116 during fault detection areoutside the expected range, a fault is detected.

Instead of using an ADC to monitor voltage drop range, other circuitry,for example, one or more comparators, can be used to provide values to acontrol circuit.

For example, FIG. 2 is a simplified block diagram showing circuitrywithin a navigation sensor circuit 201 used to drive a light emitter210. For example, navigation sensor circuit 201 is a navigation circuitsuch as those found in an optical mouse or other optical devices usedfor detection of motion. For example, navigation sensor circuit 201 isimplemented as an integrated circuit. For example, light emitter 210 isimplemented as a light emitting diode (LED), as a vertical-cavitysurface emitting laser (VCSEL) or as some other device that emits light.

Within navigation sensor 201, a programmable current source 200 sets thecurrent through light emitter 210 when a switch 212 is on. Currentsource 200 is connected, for example, to a ground voltage 203 internalto navigation sensor 201. For example, switch 212 is implemented using aField Effect Transistor (FET).

A resistor 208 is a current sensing resistor used for detection offaults such as leakage resistance. A voltage value at node a 218 isdependent on a supply voltage (VCC) 209 and a forward voltage drop(V_210) across light emitter 210. The voltage drop across switch 212 isassumed to be negligible.

A control circuit 204 periodically performs fault detection. Forexample, fault detection is performed during each frame in whichnavigation sensor circuit 201 is used to capture an image illumined bylight emitter 210. In order to perform fault detection, control circuit204 turns off FET 212. Turning off FET 212 disconnects power supply 209from light emitter 210 causing the current through light emitter 210 tobecome substantially zero. Control circuit 204 turns on an FET 206 toconnect a first reference voltage 207 to sense resistor 208. Controlcircuit 204 also sets current source 200 to a predetermined value.Substantially all the current flowing through current source 200 flowsthrough resistor 208, causing a voltage drop (V_208) across resistor208. The voltage drop (V_208) across resistor 208 is equal to thecurrent (I_208) flowing in resistor 208 multiplied by the resistancevalue (R_208) of resistor 208 (i.e., V_208=I_208 * R_208).

A set of predetermined settings for current source 200 is stored bycontrol circuit 204. For each setting, a comparator compares the voltageat node 218 with an expected voltage. A different comparator value ischecked for each expected voltage. If the voltage at node 218 is belowthe expected voltage, a leakage current (or another fault) is indicatedand a fault is detected.

For example, FIG. 2 shows two comparators: a comparator 216 and acomparator 202. This allows two expected voltages (and thus two settingsfor current source 200) to be tested. Comparator 216 compares thevoltage at node 218 with a reference voltage 211. Comparator 202compares the voltage at node 218 with a reference voltage 213. If it isdesired to test additional settings for current source 200, additionalcomparators can be added. Alternatively, a single comparator can be usedand control circuit 204 can change a voltage value for the referenceinput of the comparator for each setting of current source 200.

As discussed above, leakage can occur, for example when a spuriousconnection is made between node 218 and ground voltage 203 internal tonavigation sensor 201, or between node 218 and a ground voltage 205external to navigation sensor 201. A spurious connection between node218 and ground voltage 203 is represented by a leakage resistance 215. Aspurious connection between node 218 and ground voltage 205 isrepresented by a leakage resistance 214.

If leakage resistance 214 and/or leakage resistance 215 is present, thecurrent flowing in leakage resistance 214 and/or leakage resistance 215adds to the total current in resistor 208 which increases the voltagedrop (V_208) across resistor 208 and thus lowers the voltage present atnode 218.

Other types of faults that may be detected include the failure of FET212 to turn off, and a spurious connection between VCC 209 and node 219.Neither of these faults will cause the light emitter power to increaseduring normal operation; however, these faults do represent a potentialsafety hazard due to the loss of light source control by FET 212 in theevent leakage resistance 214 or leakage resistance 215 is present.

A control circuit 204 periodically performs fault detection. Forexample, fault detection is performed during each frame in whichnavigation sensor circuit 201 is used to capture an image illumined bylight emitter 210. In order to perform fault detection, control circuit204 turns off FET 212. Turning off FET 212 disconnects power supply 209from light emitter 210 causing the current through light emitter 210 tobecome substantially zero. Control circuit 204 also sets current source200 to a predetermined value and continues to hold FET 206 off. Underthis condition the voltage at node 218 is set by the knowncharacteristics of current source 200 and is expected to be low, forexample 0.1V. If FET 212 fails to turn off, or if a spurious connectionbetween VCC 209 and a node 219 exists, the voltage at node 218 will behigher than expected.

Other errors resulting for example, in reduction of voltage at node 218voltage are also detectable, as described above.

The principles of the present invention also apply when detectingleakage to a power supply (VCC). For example, FIG. 3 is a simplifiedblock diagram showing circuitry within a navigation sensor circuit 301used to drive a light emitter 310. For example, navigation sensorcircuit 301 is a navigation circuit such as those found in an opticalmouse or other optical devices used for detection of motion. Forexample, navigation sensor circuit 301 is implemented as an integratedcircuit. For example, light emitter 310 is implemented as a lightemitting diode (LED), as a vertical-cavity surface emitting laser(VCSEL) or some other device that emits light.

Within navigation sensor 301, a programmable current source 300regulates the current through light emitter 310 when a switch 312 is on.Current source 300 is connected, for example to a power supply (VCC) 303internal to navigation sensor 301. For example, switch 312 isimplemented using a field effect transistor (FET).

A resistor 308 is a current sensing resistor used for detection offaults such as leakage resistance. A voltage value at a node 318 isdependent on a ground voltage 305 and a forward voltage drop (V_310)across light emitter 310. The voltage drop across switch 312 is assumedto be negligible.

For example, a typical voltage value for supply voltage 303 is 2.8 volts(V). A typical voltage value at node 318 is 2.4 V. This means a typicalforward voltage drop (V_310) is equal to 2.4V. It is noted that incommon circuit design, current source 300 requires that voltage at node318 be some minimum voltage below VCC for proper operation.

A control circuit 304 periodically performs fault detection. Forexample, fault detection is performed during each frame in whichnavigation sensor circuit 301 is used to capture an image illumined bylight emitter 310. In order to perform fault detection, control circuit304 turns off FET 312. Turning off FET 312 disconnects ground voltage305 from light emitter 310 causing the current through light emitter 310to become substantially zero. Control circuit 304 turns on an FET 306 toconnect ground voltage 305 to sense resistor 308. Control circuit 304also sets current source 300 to a predetermined value. Substantially allthe current flowing through current source 300 flows through resistor308, causing a voltage drop (V_308) across resistor 308. The voltagedrop (V_308) across resistor 308 is equal to the current (I_308) flowingin resistor 308 multiplied by the resistance value (R_308) of resistor308 (i.e., V_308=I_308 * R_308).

A set of predetermined settings for current source 300 and referencevoltage 307 is stored by control circuit 304. For each setting, acomparator 302 compares the voltage at node 318 with an expectedreference voltage 307. Alternatively, additional comparators may beused, each with a unique preset reference voltage.

If no fault is detected by the comparator(s), then control circuit 304resumes normal operation of navigation sensor 301 by turning off FET 306and turning on FET 312, and restoring current source 300 to theoperating current value. The configuration of comparator 302 isexemplary.

Leakage can occur, for example when a spurious connection is madebetween node 318 and supply voltage 303 internal to navigation sensor301, or between node 318 and a supply voltage 309 external to navigationsensor 301. A spurious connection between node 318 and supply voltage303 is represented by a leakage resistance 315. A spurious connectionbetween node 318 and supply voltage 309 is represented by a leakageresistance 314.

If leakage resistance 314 and/or leakage resistance 315 is present, thecurrent flowing in leakage resistance 314 and/or leakage resistance 315adds to the total current in resistor 308. This increased currentincreases the voltage at node 318.

The source of leakage resistance 314 could be, for example, a shortcircuit on the printed circuit board, for example due to a solder ballor cut off component lead not removed during assembly, or due to anothercause. Leakage resistance 314 could also be resistive, for example, dueto contamination, for example, from a spilled soft drink, or fromanother cause. The resistance can be very small or have a resistance ofhundreds or even thousands of ohms.

The source of leakage resistance 315 could be, for example, a circuitrydefect or other damage to the integrated circuitry of navigation sensor301.

During normal operation (e.g., a normal operating mode), current flowingthrough leakage resistance 314 and/or leakage resistance 315 (if eitherof these are present) adds to the total current flowing through lightemitter 310. This increases the optical power output of light emitter310, possibly exceeding the eye safety limit specified for the product.

If, during a fault detection cycle (e.g., a test mode), the increasedvoltage at node 318 exceeds the expected reference voltage 307, a faultis detected. In this event control circuit 304 responds to the faultdetection. For example, upon detecting a fault, control circuit 304holds FET 312 off and turns current source 300 off so that light emitter310 remains off. Additionally, a user readable indicator fault flag canbe set.

While resistor 308 can be located internal to navigation sensor 301, itis currently advantageous, when navigation sensor is implemented as anintegrated circuit, to place resistor 308 external to the integratedcircuitry. When resistor 308 is located external to the integratedcircuitry, a low tolerance resistor, for example +/−1% of the nominalvalue, may be economically used. This compares to a typical tolerance of+/−20% for commonly available CMOS semiconductor processes. The lowtolerance of resistor 308 enables more precise measurement of leakageresistance 314 and leakage resistance 315, thereby allowing economicfault detection before the eye safety power is exceeded. The value ofresistor 308 is selected to achieve this goal.

Because sense resistor 308 is not in series with light emitter 310, noadditional voltage increase is introduced to node 318 during normaloperation.

In another embodiment, comparator 302 is replaced by an amplifier andADC to convert the voltage drop across sense resistor 308 to a digitalvalue. Control circuit 304 has an expected range of digital valuesstored for each setting of current source 300. If a digital valueexceeds the expected range during a test cycle, a fault is detected.

Other types of faults that may be detected include the failure of FET312 to turn off, and a spurious connection between ground voltage andnode 319. Neither of these faults will cause the light emitter power toincrease during normal operation; however, these faults do represent apotential safety hazard due to the loss of light source control by FET312 in the event leakage resistance 314 or leakage resistance 315 ispresent.

A control circuit 304 periodically performs fault detection. Forexample, fault detection is performed during each frame in whichnavigation sensor circuit 301 is used to capture an image illumined bylight emitter 310. In order to perform fault detection, control circuit304 turns off FET 312. Turning off FET 312 disconnects ground voltage305 from light emitter 310 causing the current through light emitter 310to become substantially zero. Control circuit 304 also sets currentsource 300 to a predetermined value and continues to hold FET 306 off.Under this condition the voltage at node 318 is set by the knowncharacteristics of current source 300 and is expected to be high, forexample 2.7V. If FET 312 fails to turn off, or if a spurious connectionbetween ground voltage and node 319 exists, the voltage at node 318 willbe lower than expected.

The foregoing discussion discloses and describes merely exemplarymethods and embodiments of the present invention. As will be understoodby those familiar with the art, the invention may be embodied in otherspecific forms without departing from the spirit or essentialcharacteristics thereof. Accordingly, the disclosure of the presentinvention is intended to be illustrative, but not limiting, of the scopeof the invention, which is set forth in the following claims.

1. A method for controlling a light emitter comprising the following:during a normal operating mode, regulating current flow through a lightemitter using a current generator; and, during a test mode; performingthe following: regulating current flow through a current sensingresistance using the current generator, and, detecting when current flowthrough the current sensing resistance is outside an expected range. 2.A method as in claim 1 additionally comprising: controlling a switchbetween a first voltage and the light emitter so that during the normaloperating mode, the light emitter is electrically connected to the firstvoltage, and so that during the test mode, the light emitter iselectrically disconnected from the first voltage.
 3. A method as inclaim 1 additionally comprising: controlling a switch between a firstvoltage and the current sensing resistance so that during the test mode,the current sensing resistance is electrically connected to the firstvoltage, and so that during the normal operating mode, the currentsensing resistance is electrically disconnected from the first voltage.4. A method as in claim 1 additionally comprising: controlling a firstswitch between a first voltage and the light emitter so that during thenormal operating mode, the light emitter is electrically connected tothe first voltage, and so that during the test mode, the light emitteris electrically disconnected from the first voltage; and, controlling asecond switch between a second voltage and the current sensingresistance so that during the test mode, the current sensing resistanceis electrically connected to the second voltage, and so that during thenormal operating mode, the current sensing resistance is electricallydisconnected from the second voltage.